Structural and Magnetic Properties of Nanogranular BaTiO3-CoFe2O4 Thin Films Deposited by Laser Ablation on Si/Pt Substrates
Thin film nanocomposites of cobalt ferrite (CoFe2O4) dispersed in barium titanate (BaTiO3) matrix, have been deposited with different cobalt ferrite concentrations (from 20% to 70% CoFe2O4), as well as pure barium titanate and cobalt ferrite thin films (end members). The films were prepared by pulsed laser ablation on platinum covered Si(001) substrates. The films structure was studied by X-ray diffraction and their surface was examined by scanning electron microscopy (SEM). The magnetic properties were measured in a SQUID magnetometer. The results show that the deposited films are polycrystalline with a slight (111) barium titanate phase orientation and (311) CoFe2O4 phase orientation. The grain sizes measured from the X-ray diffraction peak widths, for both phases, are in the range 40nm to 100nm. However, as the concentration of the cobalt ferrite increases, the grain size of the BaTiO3 phase decreases, from 100nm to 30nm, up to 40% CoFe2O4 concentration beyond which the BaTiO3 grain size has an approximately constant value near 30nm. On the other hand the cobalt ferrite grain size does not show a clear trend with increasing cobalt ferrite concentration, fluctuating in the range 20nm to 30nm. The magnetic measurements show an increase of the magnetic moment from the low concentration region where the magnetic grains are more isolated and their magnetic interaction is small, towards the bulk value at higher CoFe2O4 concentrations. Also, a strong reduction of the magnetization with increasing temperature was observed, due to the corresponding decrease of the magnetocristalline anisotropy of the cobalt ferrite.
António Torres Marques, António Fernando Silva, António Paulo Monteiro Baptista, Carlos Sá, Fernando Jorge Lino Alves, Luís Filipe Malheiros and Manuel Vieira
J.G. Barbosa et al., "Structural and Magnetic Properties of Nanogranular BaTiO3-CoFe2O4 Thin Films Deposited by Laser Ablation on Si/Pt Substrates", Materials Science Forum, Vols. 587-588, pp. 303-307, 2008