Thin Layered Structures Analysis Using NUR Reflectometer

Abstract:

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Reflectometry technique in Centre de Recherché Nucléaire de Draria (CRND) is operational since 2002. The instrument is used for investigation of monochromators and supermirrors. In this communication, several monochromators: 10 and 40 nickel-titanium bilayers deposited on a float-glass substrate with different period are analysed. The investigation of magnetic multilayers (25 silicon-iron bilayers monochromator) is also performed. From the results, Bragg peaks were identified indicating the periodicity of the multilayers.

Info:

Periodical:

Edited by:

N.Gabouze

Pages:

53-58

DOI:

10.4028/www.scientific.net/MSF.609.53

Citation:

M. Izerrouken "Thin Layered Structures Analysis Using NUR Reflectometer", Materials Science Forum, Vol. 609, pp. 53-58, 2009

Online since:

January 2009

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$35.00

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