Thin Layered Structures Analysis Using NUR Reflectometer

M. Izerrouken

doi:10.4028/www.scientific.net/MSF.609.53

Paper Titles

Problems with Synthesis of Chalcopyrite CuIn_1-xB_xSe₂
p.33

Phase Explosion in Silicon and Titanium Targets Irradiated by Third Harmonic Nd-YAG Pulsed Laser
p.37

Optical Properties of the Strained Layer Superlattices (GaAs)₆/(GaP)_m(001) (m=2, 4 and 6)
p.41

Characterization of a-C:H Thin Films Deposited from C₂H₄ by PECVD Microwave Discharge
p.49

Thin Layered Structures Analysis Using NUR Reflectometer
p.53

Characterization of SiOF Thin Films Deposited by PECVD from Hexamethyldisiloxane in Mixture with Oxygen and CF₄
p.59

Cyclohexyl Methacrylate with Tetra (Ethylene Glycol) Dimethacrylate in Tertahydrofuran Radical Copolymerization
p.63

Water Molecule Sensitive Layers Deposited from Hexamethyldisiloxane/Oxygen Mixture at Low Temperature
p.69

Synthesis and Characterization of New Chelating Resin Functionalized with Pyrocatechol Violet and its Application as Extractant for Zinc (II)
p.75

HomeMaterials Science ForumMaterials Science Forum Vol. 609Thin Layered Structures Analysis Using NUR...

Thin Layered Structures Analysis Using NUR Reflectometer

Abstract:

Reflectometry technique in Centre de Recherché Nucléaire de Draria (CRND) is operational since 2002. The instrument is used for investigation of monochromators and supermirrors. In this communication, several monochromators: 10 and 40 nickel-titanium bilayers deposited on a float-glass substrate with different period are analysed. The investigation of magnetic multilayers (25 silicon-iron bilayers monochromator) is also performed. From the results, Bragg peaks were identified indicating the periodicity of the multilayers.