Piezoelectric PZT Thin Films on Flexible Copper-Coated Polymer Films

Article Preview

Abstract:

This work analyzes the processing of Pb(Zr,Ti)O3 (PZT) thin films directly on copper-coated polymer films. PZT thin film deposition was performed onto the metallized Kapton® films using a single RF plasma jet. In order to reduce the interaction of PZT and Cu during the initial growth stage, an ultrathin amorphous TiO2-x seeding layer was sputter-deposited prior to PZT deposition. The film texture was a mixture of (111)-oriented perovskite nanocrystals, rutile and pyrochlore. Topography and piezoelectric in-plane and out-of-plane response of the films were evaluated using a commercial AFM adapted for piezoforce measurements. The as-deposited films were self-polarized with polarization pointing at the surface of the sample. Polarization was switchable and a piezoelectric hysteresis was obtained.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 636-637)

Pages:

392-397

Citation:

Online since:

January 2010

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2010 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Kawai: Jpn. J. Appl. Phys. 8 (1969) p.975.

Google Scholar

[2] A.M. Vinogradov, V.H. Schmidt, G.F. Tuthill and G.W. Bohannanc: Mech. Mater. 36 (2004) p.1007.

Google Scholar

[3] X. He, K. Yao and B.K. Gan: J. Appl. Phys. 97 (2005) p.084101.

Google Scholar

[4] N.D. Young, G. Harkin, R.M. Bunn, D.J. McCulloch, R.W. Wilks and A.G. Knapp: IEEE Electron Dev. Lett. 18 (1997) p.19.

Google Scholar

[5] C. -S. Yang, L.L. Smith, C.B. Arthur and G.N. Parsons: J. Vac. Sci. Technol. B 18 (2000) p.683.

Google Scholar

[6] P. Alpuim, V. Chu and J. P. Conde, in: Amorphous and Heterogeneous Silicon-Based Films, edited by J.B. Joyce, J.D. Cohen, R.W. Collins, J. Hanna, M. Stutzman, MRS Proceedings Volume 664 (2001) A18. 6.

Google Scholar

[7] N. Ueno, M. Akiyama, K. Ikeda and H. Takeyama: Trans. SICE 38 (2002) p.427.

Google Scholar

[8] M. Akiyama, Y. Morofuji, T. Kamohara, K. Nishikubo, Y. Ooishi, M. Tsubai, O. Fukuda and N. Ueno: Adv. Funct. Mater. 17 (2007) p.458.

DOI: 10.1002/adfm.200600098

Google Scholar

[9] M. Akiyama, Y. Morofuji, T. Kamohara, K. Nishikubo, M. Tsubai, O. Fukuda and N. Ueno: J. Appl. Phys. 100 (2006) p.114318.

DOI: 10.1063/1.2401312

Google Scholar

[10] P. Muralt: J. Am. Ceram. Soc. 91 (2008) p.1385.

Google Scholar

[11] R. Bruchhaus, D. Pitzer, R. Rimig, M. Schreiter and W. Wersing: Integrated Ferroelectrics 21 (1998) p.461.

DOI: 10.1080/10584589808202086

Google Scholar

[12] Y. Kuru, M. Wohlschlögel, U. Welzel and E. J. Mittemeijer: Appl. Phys. Lett. 90 (2007) p.243113.

DOI: 10.1063/1.2748332

Google Scholar

[13] A. Kuoni, R. Holzherr, M. Boillat and N.F. de Rooij: J. Micromech. Microeng. 13 (2003) p. S103.

DOI: 10.1088/0960-1317/13/4/317

Google Scholar

[14] T. Kim, S. Srinivasan, A.I. Kingon: in: Ferroelectric Thin Films XIII, edited by R. Ramesh, J.P. Maria, M. Alexe and V. Joshi, MRS Proceedings Volume 902E (2006) 0902-T02-05.

Google Scholar

[15] M. Šicha, Z. Hubicka, L. Soukup, L. Jastrabik, M. Čada and P. Špatenka: Surf. Coat. Technol. 148 (2001) p.199.

Google Scholar

[16] Z. Hubička, M. Čada, P. Adámek, P. Virostko, J. Olejníček, A. Deyneka, L. Jastrabik, K. Jurek, G. Suchaneck, M. Guenther, G. Gerlach and P. Boháč: Surf. Coat. Technol. 200 (2005) p.940.

DOI: 10.1016/j.surfcoat.2005.02.041

Google Scholar

[17] Günther, M. Fahland, J. Fahlteich, N. Schiller, presented at the 2007 Int. Symp. Flex. Electronics & Display (ISFED), Hsinchu (Taiwan), December 17-18, 2007. Information on http: /isfed. itri. org. tw/2007/files/presentation/SVI_Steffen_Guenther. pdf.

Google Scholar

[18] G. Suchaneck, Z. Hubicka, L. Jastrabik, A. Dejneka, D. Kiselev, I. Bdikin, A. Kholkin and G. Gerlach: . in: Reliability and Properties of Electronic Devices on Flexible Substrates, edited by J.R. Greer, J. Vlassak, J. Daniel and T. Tsui, Mater. Res. Soc. Symp. Proc. Volume 1116E (2009).

DOI: 10.1557/proc-1116-i03-05

Google Scholar

[19] S.B. Krupanidhi, H. Hu, V. Kumar: J. Appl. Phys. 71 (1992) p.376.

Google Scholar

[20] A. L. Kholkin, S. V. Kalinin, A. Roelofs, A. Gruverman, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, edited by. S. Kalinin, A. Gruverman, Volume 1, Springer (2006), pp.173-214.

DOI: 10.1007/978-0-387-28668-6

Google Scholar

[21] A. L. Kholkin, E. L. Colla, A. K. Tagantsev, D. V. Taylor, N. Setter, Appl. Phys. Lett. 68 (1996) p.2577.

Google Scholar

[22] Y. Saya, S. Watanabe, M. Kawai, H. Yamada and Kazumi Matsushige: Jpn. J. Appl. Phys. 39 (2000) p.3799.

Google Scholar

[23] K. Abe, N. Yanase, T. Yasumoto and T. Kawakubo: Jpn. J. Appl. Phys. 41 (2002) p.6065.

Google Scholar

[24] M. Alexe, C. Harnagea, D. Hesse and U. Gösele: Appl. Phys. Lett. 79 (2001) p.242.

Google Scholar

[25] J.A. Christman, S. -H. Kim, H. Maiwa, J. -P. Maria, B.J. Rodriguez, A.I. Kingon and R.J. Nemanich: J. Appl. Phys. 87 (2000) p.8031.

Google Scholar