Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures

Andreas Leineweber

doi:10.4028/www.scientific.net/MSF.651.131

Paper Titles

Direct Access to the Order Parameter: Parameterized Symmetry Modes and Rigid Body Movements as a Function of Temperature
p.79

“Powder 3D Parametric”- A program for Automated Sequential and Parametric Rietveld Refinement Using Topas
p.97

MEM Calculations on Apatites Containing Peroxide Using BAYMEM and TOPAS
p.105

Protein Powder Diffraction Analysis with TOPAS
p.117

Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures
p.131

WPPM: Microstructural Analysis beyond the Rietveld Method
p.155

WPPM: Advances in the Modeling of Dislocation Line Broadening
p.173

Domain Size Analysis in the Rietveld Method
p.187

The Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data
p.201

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Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures

Abstract:

Microstrain broadening due to composition variations in -FeN0.407 has been evaluated using different evaluation procedures ranging from pattern decomposition to whole-powder-pattern modelling. Details how to set up these procedures in the TOPAS suite of programs have been described. The different procedures yield essentially the same results, but they have their advantages and disadvantages, which are discussed.