WPPM: Advances in the Modeling of Dislocation Line Broadening

Abstract:

Whole Powder Pattern Modeling (WPPM) is especially useful to study line defects in powder and polycrystalline materials. As a result of recent progresses in this field, dislocation studies can be carried out for any slip system and crystal symmetry of the studied phases. Basic theory and procedures are described with the help of some representative cases of study. The use of the dislocation-related broadening in the PM2K software implementing the WPPM approach is shown with practical examples.

• Periodical: Materials Science Forum (Volume 651)
• Pages: 173-186
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.651.173
• Online since: May 2010
• Authors: Matteo Leoni, Jorge Martinez-Garcia, Paolo Scardi
• Keywords: Dislocation, Line Profile Analysis, Powder Diffraction, Whole Powder Pattern Modeling, X-Ray Diffraction (XRD)

References

[1] Hull, D. & Bacon, D. J., 1984, Introduction to Dislocations, 3rd edition (Oxford, UK: Pergamon Press).

[2] Gleiter H., 2000, Acta Materialia 48, 1-29.

[3] Snyder R.L., Fiala J., Bunge H.J. (Editors), 1999, Defect and Microstructure Analysis by Diffraction, IUCr series, (New York: Oxford University Press).

[4] Warren, B. E., 1969. X-ray Diffraction (Reading MS : Addison-Wesley).

[5] Klug, H. P. & Alexander, L. E., 1974, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (New York: Wiley).

[6] Mittemeijer E. J. & Scardi P. (Editors), 2004, Diffraction Analysis of the Microstructure of Materials, Springer Series in Materials Science, Vol. 68. (Berlin: Springer-Verlag).

DOI: 10.1007/978-3-662-06723-9

[7] Scardi P. & Leoni M., 2002, Acta Cryst. A 58, 190-200.

[8] van Berkum J., 1994, Ph. D thesis, Technical University Delft, Holland.

[9] Krivoglaz M.A., 1996, X-Ray and Neutron Diffraction in Nonideal Crystals (Berlin: SpringerVerlag).

[10] Wilkens M., 1970, in Fundamental Aspects of Dislocation Theory, ed. J.A. Simmons, R. de Wit, R. Bullough, Vol. II, Nat. Bur. Stand., (US) Spec. Publ. No 317, Washington, DC. USA, 1195.

DOI: 10.6028/nbs.sp.317v1

[11] Klimanek P. & Kužel R., 1988, J. Appl. Cryst., 21, 59.

[12] Kužel R. & Klimanek P., 1988, J. Appl. Cryst., 21, 363.

[13] Borbély A., Dragomir-Cernatescu J., Ribárik G. & Ungár T., 2003, J. Appl. Cryst. 36, 160-162.

DOI: 10.1107/s0021889802021581

[14] Martinez-Garcia J., Leoni M., Scardi P., 2009, Acta Crystallogr. A, 65, 109-119.

[15] Martinez-Garcia J., Leoni M., Scardi P., 2008, Phil. Mag. Lett. 88.

[6] 443-451.

[16] Scardi P. & Leoni M., 2004, in Diffraction Analysis of the Microstructure of Materials, edited by E.J. Mittemeijer & P. Scardi (Berlin: Springer), pp.51-91.

[17] Scardi P., Leoni M., D'Incau M., 2007, Z. Kristallogr. 222, 129-135.

[18] Leoni M., Confente T. & Scardi P., 2006, Z. Kristallogr. Suppl. 23, 249-254.

[19] Scardi P., Leoni M., 2005, Acta Materialia 53, 5229-5239.

[20] Wilkens M., 1970, Phys. Stat. Sol. (a) 2, 359.

[21] Steeds J. W., 1973, Introduction to Anisotropic Elasticity Theory of Dislocations, (Oxford UK: Clarendon Press).

[22] Ungar T. & Borbely A., 1996, Appl. Phys. Lett. 69, 3173.

[23] Popa N.C., 1998, J. Appl. Cryst. 31, 176-180.

[24] Leoni M., Martinez-Garcia J., Scardi P., 2007, J. Appl. Cryst. 40, 719-724.

[25] Martinez-Garcia J., Leoni M., Scardi P., 2007, Phys. Rev. B 76.

[17] 174117.

[26] D'Incau M., Leoni M., Scardi P., 2007, J. Mat. Research 22, 1744-1753.

[27] Chen, S. Y., Ho, N. J., and Lu, H. Y. J.A. Ceramic Society 32, 223 (2006).

[28] Every A.G. & McCurdy A.K., 1992, in: Nelson D.F. (editor). Landolt-Bornstein: Crystal and solid state physics new series, group III, 29. (Berlin: Springer Verlag) table 9, p.85.

[29] Li Z., Chan S. K., Grimsditch M. H. & Zouboulis E. S., 1991, J. Appl. Phys. 70, 7327-7332.