Domain Size Analysis in the Rietveld Method

Abstract:

The implementation of a physically-sound size broadening model for peak profiles in the Rietveld method is presented. TOPAS macros are provided and the results compared with analogous modelling performed according to advanced analysis methods such as the Whole Powder Pattern Modelling.

• Periodical: Materials Science Forum (Volume 651)
• Pages: 187-200
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.651.187
• Online since: May 2010
• Authors: W.I.F. David, Matteo Leoni, Paolo Scardi
• Keywords: Full Pattern Methods, Line Profile Analysis, Powder Diffraction, Whole Powder Pattern Modeling, X-Ray Diffraction (XRD)

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