Grain Fragmentation in Equal Channel Angular Pressed Copper

Abstract:

A comparative experimental and simulation study of oxygen-free high conductivity copper produced by equal channel angular pressing (ECAP) one-pass has been carried out by using electron backscatter diffraction (EBSD) and a recently proposed grain refinement model. The grain size and misorientation distributions were extracted from the EBSD measurements. It was found that the microstructure in the ECAP deformed copper was much more refined on the TD plane. The grain size observed experimentally can be fairly well predicted by the grain fragmentation model.

• Periodical: Materials Science Forum (Volumes 654-656)
• Pages: 1570-1573
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.654-656.1570
• Online since: June 2010
• Authors: Cheng Fan Gu, László S. Tóth, Benoît Beausir, Tim Williams, Chris H.J. Davies
• Keywords: Electron Backscatter Diffraction (EBSD), Grain Refinement, Grain Size, UFG, Ultrafine Grained

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