Kinetic Monte Carlo Simulation of the Flux Dependence of Semiconductor Quantum Dot Growth

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Abstract:

Performing an event-based continuous kinetic Monte Carlo (KMC) simulation, all the important kinetic behaviors take place during the growth of the semiconductor material in the molecular beam epitaxy (MBE) system such as deposition, diffusion, desorption, and nucleation are considered, we investigate the effects of the growth conditions which are important to form semiconductor quantum dot (QD) in MBE system. The simulation results provide a detailed characterization of the atomic kinetic effects. The KMC simulation is also used to explore the effects of anisotropy effects to the epitaxy growth of QD. We find that the flux plays an important role in determining the size of the QD. The agreement between our simulation and experiment indicates that this KMC simulation is useful to study the growth mode and the atomic kinetics during the growth of the semiconductor QDs in MBE system.

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Materials Science Forum (Volumes 663-665)

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199-202

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November 2010

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] R. Leon, P.M. Petroff, D. Leonard and S. Fafard: Science. Vol. 267 (1995), p. (1966).

Google Scholar

[2] F. Klopf, J.P. Reithmaier and A. Forchel: Appl. Phys. Lett. Vol. 77 (2000), p.1419.

Google Scholar

[3] H. Pan and S.Y.A. Yang: J. Phys.: Condens. Matter. Vol. 22 (2010), p.275302.

Google Scholar

[4] T.V. Lippen, R. Nötzel, G.J. Hamhuis, and J.H. Wolter: Appl. Phys. Lett. Vol. 85 (2004), p.118.

Google Scholar

[5] Z.M. Wang, Y.I. Mazur, and G.J. Salamo: Appl. Phys. Lett. Vol. 84 (2004), p.23.

Google Scholar

[6] R. Nötzel, T. Mano, and J.H. Wolter: J. Vac. Sci. Technol A. Vol. 22 (2004), p. (1912).

Google Scholar

[7] B.G. Liu, J. Wu, E.G. Wang, and Z. Zhang: Phys. Rev. Lett. Vol. 83 (1999), p.1195.

Google Scholar

[8] M. Meixner and E. Schöll: Phys. Rev. B. Vol. 67 (2003), p.121202.

Google Scholar

[9] H. Saito, K. Nishi, and S. Sugou: Appl. Phys. Lett. Vol. 74 (1999), p.1224.

Google Scholar

[10] S. -C. Lee, J. Kevin, Malloy and S.R.J. Brueck: J. Appl. Phys. Vol. 90 (2001), p.4163.

Google Scholar