Thin Metal Films and Multi-Layers Structure as Absorbers for Infrared Detectors

Huan Liu; Liang Song; Shun Zhou; Chang Long Cai

doi:10.4028/www.scientific.net/MSF.663-665.352

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Thin Metal Films and Multi-Layers Structure as Absorbers for Infrared Detectors
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Effect of Ammoniating Temperature on Growth of GaN Nanowires with V as Intermediate Layer
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Optical Constants of Al-Doped Er₂O₃ Films Prepared by Radio Frequency Reactive Magnetron Sputtering
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HomeMaterials Science ForumMaterials Science Forum Vols. 663-665Thin Metal Films and Multi-Layers Structure as...

Thin Metal Films and Multi-Layers Structure as Absorbers for Infrared Detectors

Abstract:

As thin metal films are known to act as wide-band absorbers for infrared radiation, in this paper Ni metal films are prepared on the Ge surface of double-sided polishing, The results showed the absorbing properties of the metal layer are strongly influenced by the dielectric function of the sensor material. This paper also describes one multi-layers structure as absorber. The structure included a reflector layer of 100-nm-thick Ti (e-beam evaporation), 2-µm-thick polyimide(spin-coating), and 14.9-nm-thick Ni film (e-beam evaporation). These contain a half transmissive thin metal film, a total reflective thin metal film and a quarter-wave polyimide film. The results showed that, measured performance matches well with theoretical predictions.

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Periodical:

Materials Science Forum (Volumes 663-665)

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352-355

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.663-665.352

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Online since:

November 2010

Authors:

Huan Liu, Liang Song, Shun Zhou, Chang Long Cai

Keywords:

Detector, Infrared Absorber, Multi-Layered Structure, Thin Metal Film

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