In Situ High Resolution Transmission Electron Microscopy Studies of High Temperature Behavior of Surface Al2O3 Thin Layer on an AlN Particle

Hiroshi Fukushima; Masanobu Azuma; Yukihiro Kanechika

doi:10.4028/www.scientific.net/MSF.675-677.123

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HomeMaterials Science ForumMaterials Science Forum Vols. 675-677In Situ High Resolution Transmission Electron...

In Situ High Resolution Transmission Electron Microscopy Studies of High Temperature Behavior of Surface Al₂O₃ Thin Layer on an AlN Particle

Abstract:

A high temperature HRTEM holder equipped with a W-coil heater was used to make insitu observation of high temperature behavior of Al2O3 very thin (about 1 nm in thickness) protective film on AlN particles. The film was used to prevent AlN particles from damages by moisture. Rapid melting and rapid solidification of very small Al2O3 particles of about 2 nm in diameter were found within about 0.2 seconds. Therefore we concluded that the Al2O3 protective film worked as the sintering additives in the high temperature heating process. In the present study, very small Al2O3 particles were identified by the space between observed lattice fringe images. It was found that a tilt boundary was instantaneously formed and annihilated in an Al2O3 particle. There was also evidence that showed the formation and annihilation of edge dislocations within seven seconds during sintering.

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Materials Science Forum (Volumes 675-677)

Pages:

123-126

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.675-677.123

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Online since:

February 2011

Authors:

Hiroshi Fukushima, Masanobu Azuma, Yukihiro Kanechika

Keywords:

Aluminum Nitride (AlN) Ceramic, High Resolution Transmission Electron Microscopy, In Situ Observation, Sintering Behaviour

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References

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