Microstructure and Magnetic Properties of FePt/Ag Nanocomposite Films with Perpendicular Orientation

Article Preview

Abstract:

[FePt(2 nm)/Ag(d nm)]10 mutilayers were deposited on single crystal MgO (100) substrates by magnetron sputtering. L10-FePt/Ag nanocomposite films with a high coercivity and a perpendicular orientation were achieved by annealing the as-deposited films at 600 °C for 15 min. The result of high resolution transmitting electron microscopy (HRTEM) shows apparent mutilayer structure of the [FePt(2 nm)/Ag(5 nm)]10 film. We also found the good epitaxial growth of FePt on MgO [001] direction. Atomic force microscopy (AFM) observation on the surface morphology showed that the surface particle size and roughness degree decrease with increasing the Ag layer thickness.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

694-698

Citation:

Online since:

June 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2011 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] D. Weller and A. Moser: IEEE Trans. Magn. Vol. 35 (1999), p.4423.

Google Scholar

[2] D. Weller, A. Moser, L. Folks, M.E. Best, W. Lee, M.F. Toney, M. Schwickert, J.U. Thiele and M.F. Doerner: IEEE Trans. Magn. Vol. 36 (2000), p.10.

DOI: 10.1109/20.824418

Google Scholar

[3] M.F. Toney, W.Y. Lee, J.A. Hedstrorm and A. Kellock: J. Appl. Phys. Vol. 93 (2003), p.9902.

Google Scholar

[4] Y.F. Xu, Z.G. Sun, Y. Qiang and D.J. Sellmyer: J. Appl. Phys. Vol. 93 (2003), p.8289.

Google Scholar

[5] D.H. Ping, M. Ohnuma, K. Hono, M. Watanabe, T. Iwasa and T. Masumoto: J. Appl. Phys. Vol. 90 (2001), p.4708.

Google Scholar

[6] M. Daniil, P.A. Farber, H. Okumura, G.C. Hadjipanayis and D. Weller: J. Magn. Magn. Mater. Vol. 246 (2002), p.297.

Google Scholar

[7] J.A. Christodoulides, Y. Huang, Y. Zhang, G.C. Hadjipanayis, I. Panagiotopoulos and D. Niarchos: J. Appl. Phys. Vol. 87 (2000), p.6938.

Google Scholar

[8] M.L. Yan, X.Z. Li, L. Gao, S.H. Liou, D.J. Sellmyer, R.J.M. Veerdonk and K.W. Wierman: Appl. Phys. Lett. Vol. 83 (2003), p.3332.

Google Scholar

[9] T. Shima, K. Takanashi, Y.K. Takahashi and K. Hono: Appl. Phys. Lett. Vol. 81 (2002), p.1050.

Google Scholar

[10] T. Shima, K. Takanashi, Y.K. Takahashi and K. Hono: Appl. Phys. Lett. Vol. 88 (2000), p.063117.

Google Scholar

[11] B.H. Li, C. Feng, T. Yang, P. Hwang, J. Teng, G.H. Yu and F.W. Zhu: J. Appl. Phys. Vol. 99 (2006), p.016102.

Google Scholar