The Pair-Doped Delta-Superlattice: An Inner Probe to Measure Monolayer Doping Fluctuations in Semiconductors

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Edited by:

G. Minchev and L. Pramatarova

Pages:

139-150

DOI:

10.4028/www.scientific.net/MSF.69.139

Citation:

A. Zehe "The Pair-Doped Delta-Superlattice: An Inner Probe to Measure Monolayer Doping Fluctuations in Semiconductors", Materials Science Forum, Vol. 69, pp. 139-150, 1991

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January 1991

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