Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis

Abstract:

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X-ray diffraction line profile analysis can be carried out on the hkl planes corresponding to the same texture component or the same crystallographic orientation fiber. It is shown that in textured polycrystalline materials or in thin films or multilayers X-ray line profiles measured on planes corresponding either to the main or the minor texture components can provide the Burgers vector population and dislocations densities in the different texture components separately. The experimental technique is outlined for textured specimens and the multiple convolutional whole profile method, i.e. the CMWP line profile analysis procedure, is presented for its capacity to determine the substructure pertaining to different texture components in textured samples.

Info:

Periodical:

Materials Science Forum (Volumes 702-703)

Edited by:

Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar

Pages:

479-484

DOI:

10.4028/www.scientific.net/MSF.702-703.479

Citation:

T. Ungár "Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis", Materials Science Forum, Vols. 702-703, pp. 479-484, 2012

Online since:

December 2011

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$35.00

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