Synthesis and Characterization of Sn Doped SiO2 by Reverse Micelle and Sol-Gel Process

Kwang Jin Jeong; Dong Sik Bae

doi:10.4028/www.scientific.net/MSF.724.225

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HomeMaterials Science ForumMaterials Science Forum Vol. 724Synthesis and Characterization of Sn Doped SiO2 by...

Synthesis and Characterization of Sn Doped SiO₂ by Reverse Micelle and Sol-Gel Process

Abstract:

Sn doped SiO₂ nanoparticles have been synthesized using a reverse micelle technique combined with metal alkoxide hydrolysis and condensation. The size of the particles and the thickness of the coating can be controlled by manipulating the relative rates of the hydrolysis and condensation reactions of tetraethyl orthosilicate (TEOS) within the micro-emulsion. The properties of the Sn doped SiO₂ nanoparticles were studied as a function of various processing parameters such as R and H value. The average size of synthesized Sn doped SiO₂ nanoparticles was about in the size range of 20-40 nm and core particle (Sn) 1-5 nm. The Sn doped SiO₂ nanoparticles were characterized by X-ray diffraction (XRD) and Transmission electron microscopy (TEM).

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Eco-Materials Processing and Design XIII

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Materials Science Forum (Volume 724)

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225-228

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.724.225

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Online since:

June 2012

Authors:

Kwang Jin Jeong, Dong Sik Bae

Keywords:

Reverse Micelle, Sn Doped SiO₂ Particles, Sol-Gel Process

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