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Fabrication and Characterization of CuInS2 Sensitized TiO2 Electrodes Based on Improved SILAR Process
Abstract:
CuInS2 quantum dots have been deposited onto mesoporous TiO2 films on TCO glass substrate via successive ionic layer absorption and reaction process (SILAR) by using three different routes and post-deposition annealing in sulfur ambiance. The influence of the deposition sequence of the In-S and Cu-S on the microstructure of CuInS2 sensitized TiO2 electrodes and the photovoltaic performance of the solar cells have been investigated. The microstructure of CuInS2 sensitized TiO2 electrodes has been investigated by using X-ray diffraction (XRD), Raman spectra, scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS) analysis. The optical absorption property of the electrodes has been detected by using UV-Vis spectroscopy, and the photovoltaic performance of CuInS2 quantum dots sensitized solar cells has been determined by cyclic voltammetry measurement. It has been found that when the Cu-S was deposited prior to In-S, the chalcopyrite phase CuInS2 could not be observed due to the sublimation of InxS during the annealing under low pressure. A small amount of CuInS2 has been detected when In-S and Cu-S was deposited alternately onto the TiO2 films. However, chalcopyrite phase CuInS2 can be obtained when In-S was deposited prior to Cu-S, and a relative high efficiency of ca. 0.92% (Voc = 0.35V, Jsc = 8.49 mA·cm-2, FF = 0.31) has been achieved via SILAR without KCN treatment and rapid thermal annealing.
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478-484
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February 2013
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© 2013 Trans Tech Publications Ltd. All Rights Reserved
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