Mapping of Phase Distribution in Electron Holography with a Stage-Scanning System

Dan Lei; Kazutaka Mitsuishi; Ken Harada; Masayuki Shimojo; Dong Ying Ju; Masaki Takeguchi

doi:10.4028/www.scientific.net/MSF.750.152

Paper Titles

Improvement of Thermoelectric Properties of CuAlO₂ by Excess Oxygen Doping in Annealing
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Influence of Intermittent Air Introduction on Formation of Zn Films by Mechanical Coating Technique
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Detection of Delamination in GFRP and CFRP by Microwaves with Focusing Mirror Sensor
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Comparison of Mechanical Properties of a Biomedical β Titanium Alloy Added with Pure Rare Earth and Rare Earth Oxides
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Mapping of Phase Distribution in Electron Holography with a Stage-Scanning System
p.152

Modeling and Simulation of Dynamic Recrystallization of GCr15 Steel Using Cellular Automaton Method
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Investigation of Bonding Interface and Strength Properties in Diffusion Bonding of MgAZ31/Al6061
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Analysis of Bonging Temperature and Interfacial Characterization of 3Y-TZP and SUS304 by Diffusion Bonding
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The Effect of H₃BO₃ Microaddition on Microstructure of Ni/MgO Sintered Compact by Co-Precipitation Method
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HomeMaterials Science ForumMaterials Science Forum Vol. 750Mapping of Phase Distribution in Electron...

Mapping of Phase Distribution in Electron Holography with a Stage-Scanning System

Abstract:

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture which selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.