Study on Electrical and Thermal Properties of Epoxy Resin/Inorganic Filler Composites for the Fully Enclosed Casting Bus Bar and its Calculation of the Temperature Field

Article Preview

Abstract:

This paper focused on the epoxy resin/inorganic filler composites. The electrical and thermal properties of the composites were tested and analyzed at room temperature. The influence of temperature on the thermal conductivity and thermal expansion coefficient was studied. Based on the electrical and thermal properties of the composites, the simulation model of the fully enclosed epoxy resin casting bus bar (FEERCB) was built, and the temperature field distribution of the FEERCB was calculated. T The study results showed that the volume resistivity, dielectric constant, dielectric loss factor and breakdown strength of the epoxy resin/inorganic filler composites were 1.74×1014Ω·cm, 3.44, 3.75 and 22.31 kV/mm respectively at room temperature. The thermal conductivity and thermal expansion coefficient of the composites were 2.55 W/m·K and 21.73×10-6 /°C, achieved the insulation requirements for FEERCB. In the temperature range of the test, with increasing temperature, the thermal conductivity reduced gradually, while the thermal expansion coefficient increased gradually. The simulation results showed that the FEERCB has remarkable performance on the heat dissipation and current carrying capability.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

191-194

Citation:

Online since:

October 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] C.S. Chiu, J.M. Lin, Y.K. Chen and S.H. Wu, et al: Electronics Packaging Technology, 2003 5th Conference (EPTC). (2003), p.425.

Google Scholar

[2] S.L. Ho, Y. Li, X. Lin, H.C.C. Wong and K.W. E. Cheng: IEEE Transactions on Magnetics. Vol. 42 (2006), p.987.

Google Scholar

[3] P. Bujard: InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. (1988), pp.44-45.

Google Scholar

[4] R. Kochetov, T. Andritsch, P.H. Morshuis and J.J. Smit: Conference Record of the 2010 IEEE International Symposium on Electrical Insulation (ISEI). (2010), pp.2-3.

Google Scholar

[5] Q. Wang, L. Zhe, J.D. Wu and Y. Yin: International Conference on Condition Monitoring and Diagnosis (CMD). (2012), p.1113.

Google Scholar

[6] Z. Han, J.W. Wood, H. Herman, C. Zhang and G. C. Stevens: Conference Record of the 2008 IEEE International Symposium on Electrical Insulation (ISEI). (2008), p.499.

Google Scholar