Cationic Distribution and Electrical Properties of Ni0.6Mn2Si0.4-xAlxO4 (0≤x≤0.04) NTC Thermistor

Sen Liang; Xiao Zhang; Hai Bo Li; Mang Mang Gao; Jin Li

doi:10.4028/www.scientific.net/MSF.868.79

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HomeMaterials Science ForumMaterials Science Forum Vol. 868Cationic Distribution and Electrical Properties of...

Cationic Distribution and Electrical Properties of Ni_0.6Mn₂Si_0.4-xAl_xO₄ (0≤x≤0.04) NTC Thermistor

Abstract:

Negative temperature coefficient (NTC) ceramics with general composition Ni_0.6Mn₂Si_0.4-xAl_xO₄ (0≤x≤0.04) were prepared by conventional solid-state reaction method and were investigated for cationic distribution and electrical properties. X-ray diffraction (XRD) confirmed that the Si cations occupied the tetrahedral site. The valence states of Mn ions were characterized by X-ray photoelectron spectral (XPS). The results showed that Mn⁴⁺ content decreased from 0.19 mol to 0.185 mol when the Si molar content declined from 0.4 to 0.1, i.e. the content of Mn⁴⁺ was 0.197mol when x was equal to 0.4. Besides, the resistivity (ρ₂₅) reached the minimum value when the Si molar content was 0 (ρ₂₅=4.07×10⁴Ω·cm).

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Materials Science Forum (Volume 868)

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79-83

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https://doi.org/10.4028/www.scientific.net/MSF.868.79

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August 2016

Authors:

Sen Liang*, Xiao Zhang, Hai Bo Li, Mang Mang Gao, Jin Li

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Cationic Distribution, NTC Thermisotor, Tetrahedral Site

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