[1]
J. Ooi, M. Dayana, A.A. Azlan, M.J. Abdullah: Materials Science Forum, Trans Tech Publ (2013), p.3.
Google Scholar
[2]
G.N. Gerasimov, M.I. Ikim, P.S. Timashev, V.F. Gromov, T.V. Belysheva, E.Y. Spiridonova, V.N. Bagratashvili, L.I. Trakhtenberg: Russ J Phys Chem a+ Vol. 89 (2015), p.1059.
DOI: 10.1134/s0036024415060126
Google Scholar
[3]
H.S. Kil, Y.J. Jung, J.I. Moon, J.H. Song, D.Y. Lim, S.B. Cho: J Nanosci Nanotechno Vol. 15 (2015), p.6193.
Google Scholar
[4]
S. Banerjee, P. Nag, S. Majumdar, P.S. Devi: Mater Res Bull Vol. 65 (2015), p.216.
Google Scholar
[5]
L. Zhang, H. Jiang, M. Selke, X.M. Wang: J Biomed Nanotechnol Vol. 10 (2014), p.278.
Google Scholar
[6]
N. Wang, H. Fan, S.Y. Ai: Chem Eng J. Vol. 260 (2015), p.785.
Google Scholar
[7]
Z. Wang, Z. Quan, J. Lin: Inorg Chem Vol. 46 (2007), p.5237.
Google Scholar
[8]
W.Y. Xie, B. Liu, S.H. Xiao, H. Li, Y.R. Wang, D.P. Cai, D.D. Wang, L.L. Wang, Y. Liu, Q.H. Li, T.H. Wang: Sensor Actuat B-Chem Vol. 215 (2015), p.125.
Google Scholar
[9]
J. Rodriguez-Carvajal, FullProf: A Rietveld refinement and pattern matching analysis program (Version: October 2013), in, Laboratoire Léon Brillouin (CEA-CNRS), France, (2013).
Google Scholar
[10]
B.D. Cullity, S.R. Stock: Elements of X-Ray Diffraction. (Prentice-Hall, 3rd ed. New Jersey, 2001).
Google Scholar
[11]
J.C.A. Menezes, N.S. Ferreira, L.G. Abraçado, M.A. Macêdo: J Nanosci Nanotechno Vol. 14 (2014), p.5903.
Google Scholar
[12]
G.K. Williamson, W.H. Hall,: Acta Metallurgica, 1 (1953) 22-31.
Google Scholar
[13]
P. Patsalas, S. Logothetidis, L. Sygellou, S. Kennou, Structure-dependent electronic properties of nanocrystalline cerium oxide films, Phys Rev B, 68 (2003).
DOI: 10.1103/physrevb.68.035104
Google Scholar
[14]
B. Choudhury, A. Choudhury, Ce3+ and oxygen vacancy mediated tuning of structural and optical properties of CeO2 nanoparticles, Mater Chem Phys, 131 (2012) 666-671.
DOI: 10.1016/j.matchemphys.2011.10.032
Google Scholar
[15]
I. Kosacki, V. Petrovsky, H.U. Anderson, P. Colomban, Raman spectroscopy of nanocrystalline ceria and zirconia thin films, J Am Ceram Soc, 85 (2002) 2646-2650.
DOI: 10.1111/j.1151-2916.2002.tb00509.x
Google Scholar
[16]
I.H. Campbell, P.M. Fauchet, The Effects of Microcrystal Size and Shape on the One Phonon Raman-Spectra of Crystalline Semiconductors, Solid State Commun, 58 (1986) 739-741.
DOI: 10.1016/0038-1098(86)90513-2
Google Scholar
[17]
J.E. Spanier, R.D. Robinson, F. Zheng, S.W. Chan, I.P. Herman, Size-dependent properties of CeO2-y nanoparticles as studied by Raman scattering, Phys Rev B, 64 (2001).
Google Scholar
[18]
Z.D. Dohcevic-Mitrovic, M.J. Scepanovic, M.U. Grujic-Brojcin, Z.V. Popovic, S.B. Boskovic, B.M. Matovic, M.V. Zinkevich, F. Aldinger, The size and strain effects on the Raman spectra of Ce1-xNdxO2-delta (0 <= x <= 0. 25) nanopowders, Solid State Commun, 137 (2006).
DOI: 10.2298/sos0703281r
Google Scholar
[19]
I. Kosacki, T. Suzuki, H.U. Anderson, P. Colomban, Raman scattering and lattice defects in nanocrystalline CeO2 thin films, Solid State Ionics, 149 (2002) 99-105.
DOI: 10.1016/s0167-2738(02)00104-2
Google Scholar
[20]
W.H. Weber, K.C. Hass, J.R. Mcbride, Raman-Study of Ceo2 - 2nd-Order Scattering, Lattice-Dynamics, and Particle-Size Effects, Phys Rev B, 48 (1993) 178-185.
Google Scholar