Adhesion Characterisation of Complex Ceramics Thin Layers Deposited on Metallic Substrate

Abstract:

There was obtained superficial layer of ceramic (made of complex oxides 80% yttrium oxide stabilized zirconium ZrO₂/8%Y₂O₃ (Metco 204B-NS) and 20% alumina Al₂O₃ (Metco 105SFP)) by plasma jet deposition at a temperature of 12000°C of particles, on substrates of iron FC250. The layers were obtained by five successive passages (60 μm thick) on samples with different surface roughness and different processed (0.34, 2.47 și 4.25 μm). For the analysis of the adhesion of ceramic layers to the substrate scratch tests were carried out and the traces analyzed by scanning electron microscopy (SEM 2D and 3D), chemical analysis EDS, and profilometry. In conclusion, it was obtained compact layers on the samples 2 and 3 with micro-cracks on the surface due to thermal gradient that occurs between the layers deposited during the five passes. Regarding the resistance, the sample with the higher roughness (sample 3) resisted most to exfoliation the layer (15 N) in contrast to the sample 2 of 14N and only 10N for the polished sample. It can be concluded that there is a dependency between the surface roughness and the thickness of layer deposited. Scratch marks presents no cracks, pores or adjacent exfoliation. The results show that the technique is suitable for obtaining thin layers of ceramic materials with a very good control of the thickness, very good adhesion to the substrate and a direct relationship between surface roughness and the quality of deposited layer.

• Periodical: Materials Science Forum (Volume 907)
• Pages: 126-133
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.907.126
• Online since: September 2017
• Authors: Costel Florea, Costică Bejinariu, Cristian Savin, Bogdan Istrate, Marcelin Benchea, Ramona Cimpoeşu*
• Keywords: Complex Ceramic, EDS, Plasma Spraying, SEM

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