Powder Diffraction and Dilatometric Study of SrFe12O19

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Abstract:

Strontium hexaferrite is a well-known material, due to its application in microelectronics. This paper is devoted to strontium hexaferrite single crystals, obtained by the spontaneous crystallization technique with sodium based flux. SrFe12O19 crystals were grounded, pressed to the tablets, and crystals cell parameters were measured by thermal X-ray diffraction technique. Coefficient of thermal expansion calculated from the X-ray thermal diffraction data is in a good agreement with dilatometric measurements.

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336-340

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February 2019

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© 2019 Trans Tech Publications Ltd. All Rights Reserved

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