Atomic Force Microscopy and Scanning Tunneling Microscopy of Aluminum Nanoislands

Abstract:

Aluminum nanoislands deposited on silicon substrate were studied by a scanning tunnelling microscopy technique. Measurements completed with spatial resolution up to 1 nm revealed a complex nanoisland structure-rhomboidally ordered near the border of the aluminum-silicon and porous structure in the islands upper parts. Volt-ampere curves demonstrated strong dependency from the film thickness and were interpreted as nanoscale effects. Kelvin probe microscopy was used for simultaneous aluminum-alumina and alumina-air surface scanning.

• Periodical: Nano Hybrids (Volume 2)
• Pages: 13-24
• DOI: https://doi.org/10.4028/www.scientific.net/NH.2.13
• Online since: August 2012
• Authors: S.G. Nedilko, V. Prorok, Stanislav Rozouvan
• Keywords: Aluminum Nanoislands, Scanning Tunnelling Microscopy, Volt-Ampere Curves

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