Advances in Automatic TEM Based Orientation Mapping

Jean-Jacques Fundenberger; Adam Morawiec; Emmanuel Bouzy

doi:10.4028/www.scientific.net/SSP.105.37

Paper Titles

Texture and Microstructure Imaging by the Moving Area Detector Method
p.3

On the Use of Texture Analysis and Orientation Stereology to Investigate Polycrystalline Materials
p.15

Texture in Hot Extruded, Hot Rolled and Laser Welded Magnesium Base Alloys
p.23

The Goss Texture Formation in Silicon Steels – Growth Selection or Oriented Nucleation?
p.29

Advances in Automatic TEM Based Orientation Mapping
p.37

Residual Strain Parameters Determinable from a CBED Pattern
p.43

Local Orientation Measurements in 3D
p.49

In Situ Texture Analysis Using Hard X-Rays
p.55

Residual Strain and Texture Measurements using Neutron-TOF-Diffraction on a Dolomite-Anhydrite Rock and a Quartz-Dunite Compound
p.61

HomeSolid State PhenomenaSolid State Phenomena Vol. 105Advances in Automatic TEM Based Orientation...

Advances in Automatic TEM Based Orientation Mapping

Abstract:

The paper is an account of TEM based automatic orientation mapping summarizing more than two years of using the system. Following a brief introduction of the system elements, some representative applications are described. We focus on the characterization of fine-grain materials, mapping of low symmetry materials (metastable chromium carbide) and semi-automatic analysis of misorientations in a fully lamellar polycrystalline (g+a2) TiAl alloy. Moreover, the current state of the TEM based system is discussed and compared to EBSD systems. In particular, the issues of spatial resolution, accuracy, map acquisition time, reliability are considered.

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Periodical:

Solid State Phenomena (Volume 105)

Pages:

37-42

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.105.37

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Online since:

July 2005

Authors:

Jean-Jacques Fundenberger, Adam Morawiec, Emmanuel Bouzy

Keywords:

Diffraction, Microstructure, Orientation Mapping, TEM

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References

[1] R.A. Schwarzer. Ultramicroscopy Vol. 67 (1997), p.19.

Google Scholar

[2] R.A. Schwarzer and H. Weiland, Proceedings of the Seventh ICOTOM, (Noordwijkerhout, The Netherlands 1984) p.839.

Google Scholar

[3] S. Zaefferer. J. Appl. Cryst. Vol. 33 (2000), p.10.

Google Scholar

[4] J.J. Fundenberger, A. Morawiec, E. Bouzy and J.S. Lecomte, Ultramicroscopy Vol. 96 (2003), p.127.

DOI: 10.1016/s0304-3991(02)00435-7

Google Scholar

[5] S.I. Wright and D.J. Dingley. Proc. EUROMAT 4 (1999), p.253.

Google Scholar

[6] N.C. Krieger Lassen, Proceedings of the 16th RISO, (Roskilde, 1995), p.405.

Google Scholar

[7] H. Paul, A. Morawiec, E. Bouzy, J.J. Fundenberger and A. Piatkowski, Microchimica Acta Vol 147 (2004), p.181.

Google Scholar

[8] E. Bouzy, J.J. Fundenberger and T. Grosdidier, Proceedings ICOTOM 13, Séoul 26-30 august (2002).

Google Scholar

[9] Dey S.R., Morawiec A, Fundenberger J. J, Hazotte A and Bouzy E (2004), In: 2nd International Conference, Texture and Anisotropy of the Polycrystals (ITAP2).

Google Scholar

[10] E. Bouzy, E. Bauer-Grosse and G. Le Caer, Phil. Mag. B, Vol. 68 (1993), p.619.

Google Scholar

[11] A. Morawiec, J. Appl. Cryst. Vol. 36 (2003), p.1319.

Google Scholar

[12] F.J. Humphreys. J. Mater. Sci. Vol. 36 (2001), p.3833.

Google Scholar

[13] A. Morawiec. J. Appl. Cryst. Vol. 32 (1999), p.788.

Google Scholar

[14] HKL Technology, Channel 5 users guide.

Google Scholar