Advances in Automatic TEM Based Orientation Mapping

Abstract:

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The paper is an account of TEM based automatic orientation mapping summarizing more than two years of using the system. Following a brief introduction of the system elements, some representative applications are described. We focus on the characterization of fine-grain materials, mapping of low symmetry materials (metastable chromium carbide) and semi-automatic analysis of misorientations in a fully lamellar polycrystalline (g+a2) TiAl alloy. Moreover, the current state of the TEM based system is discussed and compared to EBSD systems. In particular, the issues of spatial resolution, accuracy, map acquisition time, reliability are considered.

Info:

Periodical:

Solid State Phenomena (Volume 105)

Edited by:

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner

Pages:

37-42

DOI:

10.4028/www.scientific.net/SSP.105.37

Citation:

J.-J. Fundenberger et al., "Advances in Automatic TEM Based Orientation Mapping", Solid State Phenomena, Vol. 105, pp. 37-42, 2005

Online since:

July 2005

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$35.00

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