Texture Analysis with Area Detectors

Abstract:

Article Preview

Starting from simple geometric considerations concerning directions and orientations, intelligent strategies for pole figure measurements were developed for the area detector. The amount and quality of texture information contained in measured or available data sets can be directly controlled. The texture approximation is done by the component method. The method does not have any restrictions concerning the grids of sample directions in the pole figures. An almost constant information depth can be obtained at a low angle of incidence of the primary beam for the study of thin surface layers.

Info:

Periodical:

Solid State Phenomena (Volume 105)

Edited by:

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner

Pages:

71-76

DOI:

10.4028/www.scientific.net/SSP.105.71

Citation:

K. Helming and U. Preckwinkel, "Texture Analysis with Area Detectors", Solid State Phenomena, Vol. 105, pp. 71-76, 2005

Online since:

July 2005

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Price:

$35.00

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