Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer

Leszek B. Magalas

doi:10.4028/www.scientific.net/SSP.115.293

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HomeSolid State PhenomenaSolid State Phenomena Vol. 115Extrinsic Resonance Effects in a Subresonant...

Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer

Abstract:

Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.

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Periodical:

Solid State Phenomena (Volume 115)

Pages:

293-298

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.115.293

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Online since:

August 2006

Authors:

Leszek B. Magalas

Keywords:

Eigen-Frequencies, Forced Oscillations, Mechanical Loss Angle, Mechanical Spectroscopy, Resonance, Subresonant Mechanical Spectrometer

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