Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer

Abstract:

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Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.

Info:

Periodical:

Solid State Phenomena (Volume 115)

Edited by:

B.M. Darinskii and L.B. Magalas

Pages:

293-298

DOI:

10.4028/www.scientific.net/SSP.115.293

Citation:

L. B. Magalas "Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer", Solid State Phenomena, Vol. 115, pp. 293-298, 2006

Online since:

August 2006

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Price:

$35.00

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