Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer
Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.
B.M. Darinskii and L.B. Magalas
L. B. Magalas "Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer", Solid State Phenomena, Vol. 115, pp. 293-298, 2006