[1]
D.K. Young, J.A. Gupta, E. Johnston-Halperin, R. Epstein, Y. Kato, D.D. Awschalom: Semicond. Sci. Tech. Vol. 17 (2002), p.275.
Google Scholar
[2]
R. Fiederlihg, P. Grabs, W. Ossau, G. Schmidt, L.W. Molenkamp: Appl. Phys. Lett. Vol. 82 (2003), p.2160.
Google Scholar
[3]
R.C. Myers, A.C. Gossard, D.D. Awschalom: Phys. Rev B Vol. 69 (2004), p.161305.
Google Scholar
[4]
A.M. Nazmul, S. Sugahara, M. Tanaka: Phys. Rev. B. Vol. 67 (2003), p.241308.
Google Scholar
[5]
M.V. Dorokhin, Yu.A. Danilov, P.B. Demina, V.D. Kulakovskii, O.V. Vikhrova, S.V. Zaitsev, B.N. Zvonkov: J. Phys. D.: Appl. Phys. Vol. 41 (2008), p.245110.
DOI: 10.1088/0022-3727/41/24/245110
Google Scholar
[6]
S.V. Zaitsev, M.V. Dorokhin, A.S. Brichkin, O.V. Vikhrova, Yu.A. Danilov, B.N. Zvonkov, and V.D. Kulakovskii: JETP Letters Vol. 90 (2009), p.658.
DOI: 10.1134/s0021364009220056
Google Scholar
[7]
R. Kotlyar, T.L. Reinecke, M. Bayer, A. Forchel: Phys. Rev. B Vol. 65 (2001), p.085310.
Google Scholar