Preface and Conference Photo
Methods of Electron Crystallography as Tools for Materials Analysis
p.1
p.1
Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films
p.7
p.7
Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science
p.13
p.13
The Art and Application of Large Angle Convergent Beam Electron Diffraction
p.16
p.16
Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM
p.20
p.20
Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM
p.24
p.24
A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food Supplements
p.28
p.28
Physical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy
p.32
p.32
Preface and Conference Photo
Abstract:
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Info:
Periodical:
Solid State Phenomena (Volume 186)
Online since:
March 2012
Сopyright:
© 2012 Trans Tech Publications Ltd. All Rights Reserved
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