Topography Imaging of Material Surfaces Using Atomic Force Microscope

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Abstract:

The atomic force microscope (AFM) is a mechanical imaging instrument that measures the three dimensional topography at nanoscale as well as physical properties of a surface with a sharpened tip. This paper proposes an AFM imaging process for obtaining quality images in order to describe surface topography of different materials. Good topography information is a premise in nanoindentetion and in determining mechanical properties of materials. Samples used were: copper, nickel, titanium, polyamide and trabecular bone.

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Periodical:

Solid State Phenomena (Volume 188)

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199-204

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Online since:

May 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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[1] G. Yourek, A. Al-Hadlaq, R. Patel, S. McCormick, G.C. Reilly and J.J. Mao, Biological nano-structures and applications of nanostructures in biology, Springer, 2004, pp.77-76.

DOI: 10.1007/0-306-48628-8_4

Google Scholar

[2] A. Smith, Atomic force microscopy, Microbiology Today 26 (1999), pp.54-55.

Google Scholar

[3] Atomic Force Microscopy: A Guide to Understanding and Using the AFM, Galloway Group, 2004.

Google Scholar

[4] R. Howland, L. Benatar, A practical guide to scanning probe microscopy, TM Microscopes, Sunnyvale, 2000.

Google Scholar

[5] M. Stroscio, M Dutta, Biological nanostructures and applications of nanostructures in biology: Electrical, Mecanichal and Optical Properties, Kluwer Academic/Plenum Publisher, New York.

Google Scholar

[6] J. Scalf, P.E. West, Introduction to Nanoparticle Characterization with AFM, Pacific Nanotechnology, USA, 2007.

Google Scholar

[7] Digital Instruments, Scanning probe microscopy training notebook, version 3.0, Digital Instruments, Veeco Metrology Group, 2000.

Google Scholar

[8] H. Assender, V. Bliznyuk and K. Porfyrakis, How Surface Topography Relates to Materials' Properties, Science 5583(2002), pp.973-976.

DOI: 10.1126/science.1074955

Google Scholar

[9] F. Cripps, C. Anthony, Nanoindentation, Springer, USA, 2002.

Google Scholar