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HomeSolid State PhenomenaSolid State Phenomena Vols. 233-234Enhancement of Exchange Bias in NiFe/IrM,...

Enhancement of Exchange Bias in NiFe/IrM, IrMn/NiFe and NiFe/IrMn/NiFe Structures with Different Thickness of Antiferromagnetic Layer

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Abstract:

The Influence of the ferromagnetic (FM) and antiferromagnetic (AFM) layers position and of the thickness of antiferromagnetic (AFM) layer on magnetic properties of FM/AFM bilayer structures was studied. Angular dependences of the coercive force and exchange bias field were analyzed for NiFe/IrMn bilayer structures with different thickness of AFM layer. In some samples we observed the maximum values of the exchange bias field in the directions different from the magnetic easy axis.

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Solid State Phenomena (Volumes 233-234)

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427-430

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https://doi.org/10.4028/www.scientific.net/SSP.233-234.427

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July 2015

Authors:

Valeria Rodionova*, Irina Dzhun, Kseniay Chichay, Sergey Shevyrtalov, Nikolai Chechenin

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