Modelisation and Simulation of Cgs.op and Cgd.op Capacities of GaAs MESFETs OPFET

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Abstract:

An analytical of new theoretical model has been developed to study the Capacitance characteristics for an optically controlled Gallium Arsenic Metal Semiconductor Field Effect Transistor MESFET (OPFET) doped uniformly. The model takes the effects of photoconductive and photovoltaic into account that determine the device characteristics in the illuminated condition. It has been presented here for an analysis of extrinsic and intrinsic parameters such as, gate capacitances including both of the gate-source capacitances gate-drain capacitances under dark and illumination condition. The numerical results have also been compared with the reported data experience in the literature and a good agreement is observed.

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Solid State Phenomena (Volume 297)

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105-119

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September 2019

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© 2019 Trans Tech Publications Ltd. All Rights Reserved

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[1] Nandita Saha Roy, B.B. Pal and R.U. Khan,, Frequency dependent characteristics of an ion implanted GaAs MESFET with opaque gate under illumination, Journal of Light wave Technology, Vol. 18, Issue 2, Feb 2000, pp.221-229.

DOI: 10.1109/50.822796

Google Scholar

[2] V. L. N. M. Neti and S. Jit, Analytical modeling of photo-effects on the S-parameters of GaAs MESFETs, Microwave and Optical Technology Letters, (2006) 48,150.

DOI: 10.1002/mop.21290

Google Scholar

[3] Anish V, California State University, Northridge, on scaling of an ion implanted gallium nitride MESFET, A graduate project submitted in partial fulfillment of the requirements, May (2016).

Google Scholar

[4] Shan-Ping Chin and Ching-Yuan Wu, A new I-V model for short gate-length MESFET's", IEEE Trans. on Electron. 40 (1993) 712-720.

DOI: 10.1109/16.202782

Google Scholar

[5] Geoffrey W.Taylor, A Device model for an ion implanted MESFET IEEE transactions on electronic devices, vol. ED-26, No.3, March (1979).

Google Scholar

[6] Khemissi Saadeddine, Modelisation non linéaire des composants à effet de champ, Thesis of doctorat defended ,January (2009).

Google Scholar

[7] N. Merabtine, S. Amourache, Y. Saidi, M. Zaabt, C. Kenzai, New non-linear model to determine Cgs and Cgd capacities MESFET , Semiconductor Physics Quantum Electronics, Vol 6, No 3, pp.404-410, (2003).

DOI: 10.15407/spqeo6.03.404

Google Scholar

[8] A. Giorgio, A. G. Perri, An improved C-V mode of GaAs MESFETs for CAD of high speed circuits and broadband amplifiers, 5th European GaAs and related III-V compounds applications symposium, Bologna, Italy, (1997).

Google Scholar

[9] S. D'Agostino, G. D'Inzeo, P. Marietti, Analytic physics-based expressions for the empirical parameters of the Staz -Pucel MESFET model // IEEE Trans. On M. T. T.,40(7)pp.1576-1581, (1992).

DOI: 10.1109/22.146340

Google Scholar

[10] T.H. Chen, M.S. Shur, A capacitance model for GaAS MESFET.s // IEEE Trans. On Elect. Devices, 32, p.5 (1985).

Google Scholar

[11] S. D.Agostino, G. D.Inzeo, P. Marietti, Analytic physics-based expressions for the empirical parameters of the Staz -Pucel MESFET model // IEEE Trans. On M. T. T., 40(7) pp.1576-1581, (1992).

DOI: 10.1109/22.146340

Google Scholar

[12] M.S. Shur, Analytical models of GaAs FET.s // IEEE Trans.On Elect. Devices, 32, p.1 (1985).

Google Scholar

[13] N.V.L.N. Murtyand S. Jit, A new analytical model for the photo-dependent capacitances of GaAs MESFETs, with emphasis on the substrate relate defects Solid-State Electronics, (2006) 50,1716.

DOI: 10.1016/j.sse.2006.09.017

Google Scholar

[14] J.M. Zamanilo, J. Portilla, C. perez-Vega, Optical ports next generation of MMIC control devices, in procedings of Microwave Conference, European, (2005)1391.

DOI: 10.1109/eumc.2005.1610196

Google Scholar