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HomeSolid State PhenomenaSolid State Phenomena Vols. 32-33The Influence of Oxidation Induced Stacking Faults...

The Influence of Oxidation Induced Stacking Faults on Electrical Parameters of a CCD Device

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Periodical:

Solid State Phenomena (Volumes 32-33)

Pages:

353-358

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.32-33.353

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Online since:

December 1993

Authors:

P. Schley, G. Kissinger, R. Barth, K.-E. Ehwald

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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