In Situ X-Ray Investigation of Relaxation Processes in Si1-xGex Layers on Silicon Substrate
p.535
p.535
Determination of Superlattice Structural Parameters in Mismatched Epitaxial Structures
p.541
p.541
Investigation of Strain in Si1-xGex/Si Heterostructures and Local Isolation Structures by Convergent Beam Electron Diffraction
p.547
p.547
New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures
p.553
p.553
Detection of Threading Dislocations by EBIC in a SiGe Epilayer with Graded Buffer
p.559
p.559
HREM and DLTS of Σ37(610) and Σ29(520 )[001] Tilt Grain Boundaries in Ge Bicrystals
p.565
p.565
TEM In Situ Investigations of Interfacial Processes in the Pd/a-GeSi System
p.571
p.571
Micro-Raman Investigations of Elastic and Plastic Strain Relief in Si1-xGex-Heterostructures
p.577
p.577
Raman Study of the Phonon-Plasmon Modes in the Short Period GaAs/AlAs Superlattices
p.583
p.583
Detection of Threading Dislocations by EBIC in a SiGe Epilayer with Graded Buffer
Abstract:
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Periodical:
Solid State Phenomena (Volumes 32-33)
Pages:
559-564
Citation:
Online since:
December 1993
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Сopyright:
© 1993 Trans Tech Publications Ltd. All Rights Reserved
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