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Paper Titles
Preface
Polarity Effect on the Heteroepitaxial Growth of BxC on 4H-SiC by CVD
p.1
Vertical Current Transport in Monolayer MoS2 Heterojunctions with 4H-SiC Fabricated by Sulfurization of Ultra-Thin MoOx Films
p.7
Estimation of Influence on Carbon Vacancy Regarding 4H-SiC Substrate Grown by HTCVD Method
p.13
Resistivity as a Witness of Local Crystal Growth Conditions
p.19
GaN Cap UV Spectroscopy Assessment in AlGaN/GaN HEMT
p.27
SNDM Study of the MOS Interface State Densities on the 3C-SiC / 4H-SiC Stacked Structure
p.33
Development of 200mm SiC Technology - Epitaxial Thickness Uniformity Observation on Different 8 Inch 4H-SiC Substrates
p.41
4H-SiC Crystal Growth Using Recycled SiC Powder Source
p.47
HomeSolid State PhenomenaSolid State Phenomena Vol. 362Preface

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Solid State Phenomena (Volume 362)

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August 2024

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