Paper Titles

Deuterium Effusion from Microcrystalline Sputtered Silicon Thin Films: Hydrogen Stability and Bonding Configurations
p.373

Defect Structure of Multicrystalline Chemical Vapor Deposited Silicon Films
p.381

Optical and Photoelectrical Properties of Microcrystalline Silicon Layers in Relation to Structural Ordering
p.387

Photo-Induced and Thermally Stimulated Degredation in a-Si:H : Mechanism of Defect Creation
p.393

Electrical Properties and Microstructure of Metal Oxides Varistors
p.399

General and Characteristic Features of the Structure of Polycrystalline and Non-Crystalline Silicon
p.405

Properties of Anodically Oxidized Polycrystalline Silicon Layers
p.411

Properties of Multicrystalline Silicon Heat Treated by Classical and Rapid Thermal Processing
p.415

A Contribution to the Characterization of Multicrystalline Solar Silicon
p.421

HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38Electrical Properties and Microstructure of Metal...

Electrical Properties and Microstructure of Metal Oxides Varistors

Article Preview

Abstract:

You might also be interested in these eBooks

Polycrystalline Semiconductors III

Info:

Periodical:

Solid State Phenomena (Volumes 37-38)

Pages:

399-404

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38.399

Citation:

Cite this paper

Online since:

March 1994

Authors:

Nouar Tabet, N. Boulares, Claude J.A. Monty

Keywords:

Electrical Properties, Grain Boundary, Tunneling Conduction, Varistors

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1994 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: