Deuterium Effusion from Microcrystalline Sputtered Silicon Thin Films: Hydrogen Stability and Bonding Configurations

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Periodical:

Solid State Phenomena (Volumes 37-38)

Edited by:

H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud

Pages:

373-378

DOI:

10.4028/www.scientific.net/SSP.37-38.373

Citation:

L. Lusson et al., "Deuterium Effusion from Microcrystalline Sputtered Silicon Thin Films: Hydrogen Stability and Bonding Configurations", Solid State Phenomena, Vols. 37-38, pp. 373-378, 1994

Online since:

March 1994

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Price:

$35.00

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