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Modelling and Optimisation of Poly-Si Thin Film Transistors for Flat Panel Displays
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Bulk and Interface States in Polycrystalline Silicon Thin Film Transistors
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Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors
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HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38Hot Carrier Induced Degradation in Polycrystalline...

Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors

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Abstract:

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Polycrystalline Semiconductors III

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Periodical:

Solid State Phenomena (Volumes 37-38)

Pages:

583-588

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38.583

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Online since:

March 1994

Authors:

G. Fortunato, G. Tallarida, A. Pecora

Keywords:

Degradation, Hot Carriers, Thin Film Transistor

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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