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Cathodoluminescence Microscopy of Square Facets in Chemial Vapour Deposited Diamond Films and its Use in Stress Determination
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Modelling of Specular Reflection Infrared Spectra of Oxide Films for Microstructural Analysis
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Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates
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HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Cathodoluminescence Microscopy of Square Facets in...

Cathodoluminescence Microscopy of Square Facets in Chemial Vapour Deposited Diamond Films and its Use in Stress Determination

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Polycrystalline Semiconductors IV

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Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

271-282

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.271

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Online since:

May 1996

Authors:

John W. Steeds, N.C. Burton, A.R. Lang, D. Pickard, Yu.G. Shreter, James E. Butler

Keywords:

Cathodoluminescence Microscopy, Chemical Vapor Deposited Diamond, Nitrogen Impurities, Square Facets, Stress Determination, Tungsten Impurities

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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