Paper Titles

Structure and Optical Properties of Hydrogenated Silicon Films Prepared by Plasma Enhanced Chemical Vapour Deposition
p.249

Growth of Polycrystalline Silicon Films at High Deposition Rate and Low Temperature by Hot Wire Chemical Vapour Deposition
p.255

Grain Boundaries and Grain Size Distributions in Nanocrystalline Diamond Films Derived from Fullerene Precursors
p.261

Cathodoluminescence Microscopy of Square Facets in Chemial Vapour Deposited Diamond Films and its Use in Stress Determination
p.271

Transformations in Si_1-xGe_x:H Films on SiO₂ Substrates
p.283

Modelling of Specular Reflection Infrared Spectra of Oxide Films for Microstructural Analysis
p.289

Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates
p.295

Phase Transitions during the Deposition of Polycrystalline Iron Pyrite (FeS₂) - Layers by Low-Pressure Metalorganic Chemical Vapor Deposition
p.301

Distribution of Defects in Polycrytalline Chalcopyrite Thin Films
p.309

HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Transformations in Si1-xGex:H Films on SiO2...

Transformations in Si_1-xGe_x:H Films on SiO₂ Substrates

Article Preview

Abstract:

You might also be interested in these eBooks

Polycrystalline Semiconductors IV

Info:

Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

283-288

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.283

Citation:

Cite this paper

Online since:

May 1996

Authors:

F. Edelman, R. Weil, P. Werner, Manfred Reiche, E. Schroer, J. Heydenreich, W. Beyer

Keywords:

Crystallization, Doping Effect, Hydrogenated Silicon-Germanium, Phase Diagram

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: