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HomeSolid State PhenomenaSolid State Phenomena Vol. 55Field Effect Studies on MIS-Structure of P-Type...

Field Effect Studies on MIS-Structure of P-Type CulnTe₂ Films Having Excess Cu and In

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Semiconductor Materials and Technology (ICSMT)

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Periodical:

Solid State Phenomena (Volume 55)

Pages:

149-152

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.55.149

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Online since:

August 1997

Authors:

M. Dashtiani, O.P. Sharma, B.R. Sethi

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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