Paper Titles

Cathodoluminescence from Nanocrystalline Silicon Films in the Scanning Electron Microscope
p.191

The Spatial Distribution of Modulated CL Signal in Inhomogeneous Semiconductors with Large Diffusion Length
p.199

Effect of Plastic Deformation on the Luminescence of ZnSe Crystals
p.207

Effect of Erbidum on the Luminescence Properties of GaSb Crystals
p.215

Direct Imaging of the Crystalline and Chemical Nanostructure of GA,IN-Nitrides by Highly Spatially-, Spectrally- and Time-Resolved Cathodoluminescence
p.221

Cathodoluminescence and Photoluminescence Characterisation of Etched Mesas of ZnTe/ZnMgTe Quantum Wells under Tensile Strain
p.229

Cathodoluminescence Study of Defect Distribution at Different Depths in Films SiO₂/Si
p.237

Cathodoluminescence Dependence on Beam Generation Conditions and Surface Properties of Materials
p.243

Neat Field Optics: Comeback of Light in Microscopy
p.251

HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Direct Imaging of the Crystalline and Chemical...

Direct Imaging of the Crystalline and Chemical Nanostructure of GA,IN-Nitrides by Highly Spatially-, Spectrally- and Time-Resolved Cathodoluminescence

Article Preview

Abstract:

You might also be interested in these eBooks

Beam Injection Assessment of Defects in Semiconductors

Info:

Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

221-228

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.221

Citation:

Cite this paper

Online since:

December 1998

Authors:

D. Rudloff, F. Bertram, T. Riemann, J. Christen, T. Böttcher, H. Selke, D. Hommel, K. Hiramatsu

Keywords:

Cathodoluminescence, ELOG, Gallium Nitride (GaN), InGaN

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1998 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: