Volumes

Solid State Phenomena
Vols. 73-75

Solid State Phenomena
Vol. 72

Solid State Phenomena
Vol. 71

Solid State Phenomena
Vols. 69-70

Solid State Phenomena
Vols. 67-68

Solid State Phenomena
Vols. 65-66

Solid State Phenomena
Vols. 63-64

Solid State Phenomena
Vols. 61-62

Solid State Phenomena
Vols. 59-60

Solid State Phenomena
Vols. 57-58

Solid State Phenomena
Vol. 56

Solid State Phenomena
Vol. 55

Solid State Phenomena
Vol. 54

HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64

Solid State Phenomena Vols. 63-64

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64

Export:

ToC:

Table of Contents

1
2
3
4
5
…
>
>>

Paper Title Page

Preface

Charge Collection Scanning Microscopy: Non-Conventional Applications

Authors: Antonio Castaldini, Anna Cavallini

1

EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures

Authors: B. Sieber, J.-L. Farvacque

13

EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement

Authors: Carl E. Norman, N. Griffin, D.D. Arnone, D.J. Paul, M. Pepper, B. Gallas, J.M. Fernández

25

Laser Induced Mapping for Separation of Bulk and Surface Recombination

Authors: H.-C. Ostendorf, A.L. Endrös

33

Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current

Authors: C. Donolato

45

Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.

Authors: Santo Martinuzzi, Isabelle Périchaud, Scott A. McHugo

53

Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers

Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi

61

Characterization of Laser Structures by EBIC Measurements and Simulation

Authors: I. Rechenberg, H. Wenzel, A. Knauer, G. Beister

69

Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC

Authors: Martin Kittler, J. Lärz

77

1
2
3
4
5
…
>
>>