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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64

Solid State Phenomena Vols. 63-64

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64

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Table of Contents

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Paper Title Page

Neat Field Optics: Comeback of Light in Microscopy

Authors: D.W. Pohl

251

Near-Field Cathodoluminescence (NF-CL) Investigations on Semiconducting Materials

Authors: V. Ebinghaus, R.M. Cramer, R. Heiderhoff, L.J. Balk

257

Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon

Authors: Hans Joachim Müssig, Jaroslaw Dąbrowski

261

Correlative SEM/STM Study of Local Electronic Properties in Compound Semiconductors

Authors: J. Piqueras, G.N. Panin, C. Díaz-Guerra, P. Hidalgo, B. Méndez

273

Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)

Authors: J.F. Bresse

283

The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors

Authors: Reinhard Krause-Rehberg, S. Eichler, J. Gebauer, F. Börner

291

Minority Carrier Transient Spectroscopy of Copper-Silicide and Nickel-Disilicide Precipitates in Silicon

Authors: O.F. Vyvenko

301

Grain Growth of ZnSe Recrystallized in the Solid Phase

Authors: S. Fusil, A. Zozime, R. Pénelle, F. Grillon, C. Le Paven, Andre Rivière, R. Triboulet

311

Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES

Authors: R.P. Mikalo, P. Hoffmann, Th. Heller, D. Schmeißer

317

Application of Surface Electron Beam Induced Voltage Method for the Contactless Characterization of Semiconductor Structures

Authors: E.I. Rau, A.N. Zhukov, Eugene B. Yakimov

327

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