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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Correlative SEM/STM Study of Local Electronic...

Correlative SEM/STM Study of Local Electronic Properties in Compound Semiconductors

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

273-282

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.273

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Online since:

December 1998

Authors:

J. Piqueras, G.N. Panin, C. Díaz-Guerra, P. Hidalgo, B. Méndez

Keywords:

Cathodoluminescence, Correlative Microscopy, Electron Beam Induced Current (EBIC), Scanning Tunneling Microscopy (STM), Spectroscopy

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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