Volumes

Solid State Phenomena
Vols. 73-75

Solid State Phenomena
Vol. 72

Solid State Phenomena
Vol. 71

Solid State Phenomena
Vols. 69-70

Solid State Phenomena
Vols. 67-68

Solid State Phenomena
Vols. 65-66

Solid State Phenomena
Vols. 63-64

Solid State Phenomena
Vols. 61-62

Solid State Phenomena
Vols. 59-60

Solid State Phenomena
Vols. 57-58

Solid State Phenomena
Vol. 56

Solid State Phenomena
Vol. 55

Solid State Phenomena
Vol. 54

HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64

Solid State Phenomena Vols. 63-64

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64

Export:

ToC:

Table of Contents

<<
<
…
3
4
5
6
7
>

Paper Title Page

Modification of Electronical and Optical Properties in SiO₂ Films by Electron Beam Irradiation

Authors: Hans Joachim Fitting, A. von Czarnowski, A.N. Trukhin, M. Goldberg, T. Barfels

333

Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides

Authors: O.V. Fursenko, T.V. Semikina, A.N. Shmyrjeva

341

Non-Destructive Investigations of Co and CoSi_2-x Films on Si Substrate

Authors: N.L. Dmitruk, O.V. Fursenko, Arthur Medvid, D. Knight, A. Grigonis

347

Characterization of Laser-Irradiated Cd_xHg_1-xTe Solid Solutions by Scanning Microscopy Method

Authors: V.A. Gnatyuk

353

Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials

Authors: Xing Gang Liu, L.J. Balk, G. Shafirstein, A. Eckau, Qing Rui Yin

361

The Nature of the Electronic States of Cu₃Si-Precipitates in Silicon

Authors: Andreas Sattler, Henrik Hedemann, Andrei A. Istratov, Michael Seibt, Wolfgang Schröter

369

TEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers

Authors: Cesare Frigeri, A. Brinciotti, D.M. Ritchie, A. Di Paola

375

The Assessment of Micro-Analytical Techniques to the Semiconductor Manufacturing Environment

Authors: J.L Corbacho, A. Urquía, Asunción Fernández, G. Sánchez, M. Recio, V. Martín, F. Barbado, C. Morilla, A. Riloba, J. M. de la Hoz

383

Gate Oxide Defect Analysis Using Scanning Electron Microscopy (SEM)/Metal Oxide Semiconductor (MOS)/Electron Beam Induced Current (EBIC) with Sub-Nano Ampere Current Breakdown

Authors: M. Tamatsuka, K. Miki

395

Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique

Authors: H. Tomokage, Y. Ishiwata, H. Souno, Masahiro Kawakami, N. Sonoda

407

<<
<
…
3
4
5
6
7
>