Non-Destructive Investigations of Co and CoSi2-x Films on Si Substrate

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Periodical:

Solid State Phenomena (Volumes 63-64)

Edited by:

M. Kittler, O. Breitenstein, A. Endrös, W. Schröter

Pages:

347-352

DOI:

10.4028/www.scientific.net/SSP.63-64.347

Citation:

N.L. Dmitruk et al., "Non-Destructive Investigations of Co and CoSi2-x Films on Si Substrate", Solid State Phenomena, Vols. 63-64, pp. 347-352, 1998

Online since:

December 1998

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$35.00

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