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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64TEM and Photoluminescence Investigations of...

TEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

375-382

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.375

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Online since:

December 1998

Authors:

Cesare Frigeri, A. Brinciotti, D.M. Ritchie, A. Di Paola

Keywords:

Critical Thickness, InGaAs/GaAs SQW, Interface, Misfit Dislocation, Misoriented Substrates, Photoluminescence (PL), TEM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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