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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Analysis of Non-Uniform Contamination Profiles by...

Analysis of Non-Uniform Contamination Profiles by Lifetime Data

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

413-420

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.413

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Online since:

December 1998

Authors:

Maria Luisa Polignano, Domenico Caputo, Giuseppe Pavia, F. Zanderigo

Keywords:

Carrier Lifetime, Gold, Molibdenum, Silicon

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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