Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.

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Periodical:

Solid State Phenomena (Volumes 63-64)

Edited by:

M. Kittler, O. Breitenstein, A. Endrös, W. Schröter

Pages:

53-60

DOI:

10.4028/www.scientific.net/SSP.63-64.53

Citation:

S. Martinuzzi et al., "Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.", Solid State Phenomena, Vols. 63-64, pp. 53-60, 1998

Online since:

December 1998

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$35.00

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