EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 63-64)

Edited by:

M. Kittler, O. Breitenstein, A. Endrös, W. Schröter

Pages:

25-32

DOI:

10.4028/www.scientific.net/SSP.63-64.25

Citation:

C. E. Norman et al., "EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement", Solid State Phenomena, Vols. 63-64, pp. 25-32, 1998

Online since:

December 1998

Export:

Price:

$35.00

In order to see related information, you need to Login.