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HomeSolid State PhenomenaSolid State Phenomena Vols. 67-68Optical Characterization of Ru2Si3 and Ru2Ge3 by...

Optical Characterization of Ru₂Si₃ and Ru₂Ge₃ by Various Spectroscopic Methods and by Band Structure Calculations

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Polycrystalline Semiconductors V

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Periodical:

Solid State Phenomena (Volumes 67-68)

Pages:

471-476

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.67-68.471

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Online since:

April 1999

Authors:

W. Henrion, M. Rebien, V.N. Antonov, O. Jepsen

Keywords:

Band Structure, Ellipsometry, Optical Property

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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